Dynamics of surface-coupled microcantilevers in force modulation atomic force microscopy - magnetic vs. dither piezo excitation
نویسندگان
چکیده
منابع مشابه
Effects of Fluid Environment Properties on the Nonlinear Vibrations of AFM Piezoelectric Microcantilevers
Nowadays, atomic-force microscopy plays a significant role in nanoscience and nanotechnology, and is widely used for direct measurement at atomic scale and scanning the sample surfaces. In tapping mode, the microcantilever of atomic-force microscope is excited at resonance frequency. Therefore, it is important to study its resonance. Moreover, atomic-force microscopes can be operated in fluid e...
متن کاملQuantitative force and dissipation measurements in liquids using piezo-excited atomic force microscopy: a unifying theory.
The use of a piezoelectric element (acoustic excitation) to vibrate the base of microcantilevers is a popular method for dynamic atomic force microscopy. In air or vacuum, the base motion is so small (relative to tip motion) that it can be neglected. However, in liquid environments the base motion can be large and cannot be neglected. Yet it cannot be directly observed in most AFMs. Therefore, ...
متن کاملAnalytical model of the nonlinear dynamics of cantilever tip-sample surface interactions for various acoustic atomic force microscopies
An analytical model is developed of the interaction of the cantilever tip of an atomic force microscope with the sample surface that treats the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. To maintain equilibrium, the volume element is subjected to a restoring force from the remainder of t...
متن کاملFast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor
We report a new method of achieving tip–sample distance regulation in an atomic force microscope ~AFM!. A piezoelectric quartz tuning fork serves as both actuator and sensor of tip–sample interactions, allowing tip–sample distance regulation without the use of a diode laser or dither piezo. Such a tuning fork has a high spring constant so a dither amplitude of only 0.1 nm may be used to perform...
متن کاملTheoretical basis of parametric-resonance-based atomic force microscopy
Parametric resonance underpins the physics of swings, resonant surface waves, and particle traps. There is increasing interest in its potential applications in atomic force microscopy AFM . In this paper, the dynamics of parametrically resonant microcantilevers for high sensitivity imaging and force spectroscopy applications is investigated theoretically. Detailed numerical parametric-resonance...
متن کامل